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Showing items 26-45 of 45 (2 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:21:32Z |
Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors under Hot-Carrier Stress
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Chung, Wan-Fang; Chang, Ting-Chang; Lin, Chia-Sheng; Tu, Kuan-Jen; Li, Hung-Wei; Tseng, Tseung-Yuen; Chen, Ying-Chung; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:17:35Z |
Tapered Cu pattern metallization by electrodeposition through mask
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Jenq, Shrane Ning; Wan, Chi Chao; Wang, Yung Yun; Li, Hung Wei; Liu, Po Tsun; Chen, Jing Hon |
| 國立交通大學 |
2014-12-08T15:15:33Z |
Forming tapered pattern by Cu electrodeposition through mask on Ni seed layer for thin-film transistors
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Jenq, Shrine Ning; Wan, Chi Chao; Wang, Yung Yun; Li, Hung Wei; Liu, Po Tsun; Chen, Jing Hon |
| 國立交通大學 |
2014-12-08T15:12:56Z |
Elimination of photoleakage current in poly-Si TFTs using a metal-shielding structure
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Lu, Hau-Yan; Chang, Ting-Chang; Liu, Po-Tsun; Li, Hung-Wei; Hu, Chin-Wei; Lin, Kun-Chih; Tai, Ya-Hsiang; Chi, Sien |
| 國立交通大學 |
2014-12-08T15:12:18Z |
Reduction of photoleakage current in polycrystalline silicon thin-film transistor using NH(3) plasma treatment on buffer layer
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Lu, Hau-Yan; Chang, Ting-Chang; Liu, Po-Tsun; Li, Hung-Wei; Hu, Chin-Wei; Lin, Kun-Chin; Wang, Chao-Chun; Tai, Ya-Hsiang; Chi, Sien |
| 國立交通大學 |
2014-12-08T15:12:03Z |
Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias Stress
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Shih-Ching; Chuang, Ying-Shao; Chen, Te-Chih; Tai, Ya-Hsiang; Lee, Ming-Hsien; Chen, Jim-Shone |
| 國立交通大學 |
2014-12-08T15:11:54Z |
Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stress
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Yi-Chuan; Chen, Te-Chih; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:44Z |
Environment-dependent thermal instability of sol-gel derived amorphous indium-gallium-zinc-oxide thin film transistors
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Chung, Wan-Fang; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Chen, Yu-Chun; Tseng, Tseung-Yuen; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:10:21Z |
Illumination-Assisted Negative Bias Temperature Instability Degradation in Low Temperature Polycrystalline Silicon Thin-Film Transistors
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Hsu, Wei-Che; Chen, Shih-Ching; Li, Hung-Wei; Tu, Kuan-Jen; Jian, Fu-Yen; Chen, Te-Chih |
| 國立交通大學 |
2014-12-08T15:09:36Z |
A low-temperature method for improving the performance of sputter-deposited ZnO thin-film transistors with supercritical fluid
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Chen, Min-Chen; Chang, Ting-Chang; Huang, Sheng-Yao; Chang, Kuan-Chang; Li, Hung-Wei; Chen, Shih-Ching; Lu, Jin; Shi, Yi |
| 國立交通大學 |
2014-12-08T15:08:23Z |
Anomalous Capacitance Induced by GIDL in P-Channel LTPS TFTs
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Chen, Shih-Ching; Jian, Fu-Yen; Li, Hung-Wei; Chen, Te-Chih; Weng, Chi-Feng; Lu, Jin; Hsu, Wei-Che |
| 國立交通大學 |
2014-12-08T15:08:02Z |
Unusual Threshold Voltage Shift Caused by Self-Heating-Induced Charge Trapping Effect
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Jian, Fu-Yen; Chang, Ting-Chang; Chu, An-Kuo; Chen, Te-Chih; Chen, Shih-Ching; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh |
| 國立交通大學 |
2014-12-08T15:07:52Z |
Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Hsu, Wei-Che; Chen, Shih-Ching; Tai, Ya-Hsiang; Jian, Fu-Yen; Chen, Te-Chih; Tu, Kuan-Jen; Wu, Hsing-Hua; Chen, Yi-Chan |
| 國立交通大學 |
2014-12-08T15:07:50Z |
Analysis of Anomalous Capacitance Induced by TAGIDL in p-Channel LTPS TFTs
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Jian, Fu-Yen; Chuang, Ying-Shao; Chen, Te-Chih; Chen, Yu-Chun; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:06:41Z |
Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Lu, Jin; Chung, Wan-Fang; Tai, Ya-Hsiang; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:05:29Z |
Formation and nonvolatile memory characteristics of W nanocrystals by in-situ steam generation oxidation
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Chen, Shih-Cheng; Chang, Ting-Chang; Hsieh, Chieh-Ming; Li, Hung-Wei; Sze, S. M.; Nien, Wen-Ping; Chan, Chia-Wei; Yeh (Huang), Fon-Shan; Tai, Ya-Hsiang |
| 國立成功大學 |
2013 |
Dependence of Light-Accelerated Instability on Bias and Environment in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu; Chen, Yi-Hsien; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013 |
Analysis of Electrical Characteristics and Reliability Change of Zinc-Tin-Oxide Thin-Film Transistors by Photo-Thermal Treatment
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu |
| 國立成功大學 |
2012-11-26 |
The suppressed negative bias illumination-induced instability in In-Ga-Zn-O thin film transistors with fringe field structure
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Hsieh, Tien-Yu; Chen, Te-Chih; Wu, Chang-Pei; Chou, Cheng-Hsu; Chung, Wang-Cheng; Chang, Jung-Fang; Tai, Ya-Hsiang |
| 國立成功大學 |
2012-06-25 |
High-stability oxygen sensor based on amorphous zinc tin oxide thin film transistor
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Wu, Chang-Pei; Chen, Shih-Ching; Lu, Jin; Chen, Yi-Hsien; Tai, Ya-Hsiang |
Showing items 26-45 of 45 (2 Page(s) Totally)
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